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Table 4.2: The paremeter obtained from fitting given

the value of neutron wavelength for diffraction instru-

ment.

MC λ = M ∗ cos(∆θ/2)

2.07227 -5.49x10–4 2.072267

Figure 4.3: The Bragg peaks for hkl plane [111],[220],[311],[400]

and [310] of standard Si powder in determination of neutron
wavelength for diffraction instruments.

4.4 Application of Neutron Diffrac-
tions

Diffractometer device is not commercially available on-
shelf, which is not a case for X-Ray Diffraction instru-

83